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Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 245, Issue 2, 2006, Pages 528-538

New program to estimate layer thicknesses from CEMS spectra

(2) Nagy, Ferenc a Klencsár, Zoltán b

a EÖTVÖS LORÁND UNIVERSITY (Hungary)

b SZENT ISTVÁN UNIVERSITY (Hungary)

Author keywords

CEMS; M ssbauer spectroscopy; Multilayers

Indexed keywords

COMPOSITION; ELECTRON SPECTROSCOPY; LAYERED MANUFACTURING; SPECTRUM ANALYSIS;

CONVERSION ELECTRON MÖSSBAUER SPECTROSCOPY; LAYER THICKNESS; MÖSSBAUER SPECTROSCOPY; NANOLAYERS;

MULTILAYERS;

EID: 33644752797 PISSN: 0168583X EISSN: None Source Type: Journal
DOI: 10.1016/j.nimb.2005.11.049 Document Type: Article

Times cited : (9)

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