Scanning electron microscope imaging in liquids - Some data on electron interactions in water

Journal of Microscopy

Volumn 221, Issue 2, 2006, Pages 84-88

  Joy, D C ^a,b   Joy, C S ^a  

^a University of Tennessee Knoxville   (United States)

^b OAK RIDGE NATIONAL LABORATORY   (United States)

Author keywords

Backscattering coefficient; Electron range; Mean ionization potential; Secondary electron yield

Indexed keywords

ATOMS; BACKSCATTERING; HYDROGEN BONDS; INTELLIGENT SYSTEMS; IONIZATION OF LIQUIDS; IONIZATION POTENTIAL; MONTE CARLO METHODS; SCANNING ELECTRON MICROSCOPY;

BACKSCATTERING COEFFICIENTS; ELECTRON BACKSCATTERING; ELECTRON RANGE; ELECTRON'S INTERACTIONS; ENERGY RANGES; LIQUID WATER; MEAN IONIZATION POTENTIAL; MICROSCOPE IMAGING; SCANNING ELECTRONS; SECONDARY ELECTRON YIELD;

ELECTRONS;

ICE; WATER;

ARTICLE; ELECTRON; ENERGY; HYDROGEN BOND; IONIZATION; LIQUID; MATHEMATICAL COMPUTING; MOLECULAR INTERACTION; MONTE CARLO METHOD; PRIORITY JOURNAL; SCANNING ELECTRON MICROSCOPE; SCANNING ELECTRON MICROSCOPY;

EID: 33644751928     PISSN: 00222720     EISSN: 13652818     Source Type: Journal    
DOI: 10.1111/j.1365-2818.2006.01548.x     Document Type: Article

References (20)

1. Ashley J.C. 1982 Stopping power of liquid water for low energy electrons RadRes 89 25 32
2. Berger M.J. Seltzer S.M. 1964 Studies in penetration of charged particles in matter NuclSecSerRep 39 NAS-SRC Washington DC 205
3. Castaing R. 1960 Electron probe microanalysis AdvElectronElectron Phys 13 317 385
4. Goldstein J. Newbury D.E. Joy D.C. et al. 2005 Scanning Electron Microscopy and X-Ray Microanalysis 3rd edn Kluwer Academic/Plenum Publishers New York
5. Heinrich K.F.J. 1981 Electron Beam Microanalysis Van Nostrand New York
6. Hilleret N. Bojko J. Grobner O. Henrist B. Scheuerlein C. Taborelli M. 2000 Personal communication of paper The secondary electron yield of technical materials and its variation with surface treatments Presented at 7th European Particle Accelerator Conference, Vienna
7. Hovington P. Drouin D. Gauvin R. 1997 CASINO A New Monte Carlo code in C language SCANNING 19 1 14
8. Howell P.G.T. Davy K.M.W. Boyde A. 1998 Mean atomic number and backscattered electron coefficient for some materials of low mean atomic number SCANNING 20 35 40
9. Hunger H.J. Kuchler L. 1979 Measurements of electron backscattering coefficient for quantitative EPMA in the energy range 4-4 0keV PhysStatSol (A) 56 K45 K48
10. I.C.R.U. 1983 Stopping Powers of Electrons and Positrons Report 37 to the International Committee on Radiation Units. ICRU Bethesda MD
11. Joy D.C. 1996 Monte Carlo Modeling for Microscopy and Microanalysis Oxford University Press New York
12. Joy D.C. Joy C.S. Bunn R.D. 1996a Experimental measurements of the efficiency, and static and dynamic response of electron detectors in the SEM Scanning 18 181 190
13. Joy D.C. Luo S. Gauvin R. Hovington P. Evans N. 1996b Experimental measurements of electron stopping power at low energies ScanMicrosc 10 653 666
14. Lowney J. 1995 MONSEL II - Monte Carlo simulation of SEM signals for linewidth metrology Microbeam Anal 4 131 136
15. Luo S. Zhang X. Joy D.C. 1991 Experimental measurements of electron stopping power RadEffDefects Solids 117 235 247
16. 2O JPhysChem 89 930 936
17. Schenk M. Futing M. Reichelt R. 1998 Direct visualization of a water mensicus by SEM JApplPhys 84 4880 4884
18. Suszcynsky D.M. Borovsky J.E. Goertz C.K. 1992 Secondary electrons yields of solar system ices JGeophysRes 97 E2 2611 2619
19. Thiberge S. Zik O. Moses E. 2004 An Apparatus for imaging liquids, cells, and other wet samples in the SEM RevSciInstrum 75 2280 2289
20. Thiel B.L. Stokes D.J. Phifer D. 1999 Secondary electron yield of water MicroscMicroanal 5 Suppl. 2 282 283