|
Volumn 32, Issue 1, 2006, Pages 93-98
|
Flotation separation of SiC from wastes in the silicon wafer slicing process
|
Author keywords
Fine Particle; Flotation; Semiconductor Production; SiC; SiO2
|
Indexed keywords
ADSORPTION;
FLOTATION;
FLOW OF FLUIDS;
PARTICLE SIZE ANALYSIS;
PH EFFECTS;
POSITIVE IONS;
SILICA;
SILICON WAFERS;
SURFACE ACTIVE AGENTS;
FINE PARTICLES;
SEMICONDUCTOR PRODUCTION;
SIC;
SIO2;
SILICON CARBIDE;
|
EID: 33644751314
PISSN: 0386216X
EISSN: 13499203
Source Type: Journal
DOI: 10.1252/kakoronbunshu.32.93 Document Type: Article |
Times cited : (27)
|
References (7)
|