Confidence intervals for the mean of lognormal data with excess zeros

Biometrical Journal

Volumn 48, Issue 1, 2006, Pages 149-156

  Tian, Lili ^a   Wu, Jianrong ^b  

^a University of Florida ^*  (United States)

^b ST JUDE CHILDREN S RESEARCH HOSPITAL   (United States)

Author keywords

Adjusted signed log likelihood ratio; Goodness of fit test; Skewed distribution; Sufficient statistic

Indexed keywords

CODES (SYMBOLS);

ADJUSTED SIGNED LOG-LIKELIHOOD RATIO; CONFIDENCE INTERVAL; EXTENSIVE SIMULATIONS; GOODNESS OF FIT; GOODNESS-OF-FIT TEST; LOG LIKELIHOOD RATIO; LOG-NORMAL; SIGNED LOG-LIKELIHOOD RATIO STATISTICS; SKEWED DISTRIBUTION; SUFFICIENT STATISTICS;

FINANCIAL DATA PROCESSING;

EID: 33644684770     PISSN: 03233847     EISSN: 15214036     Source Type: Journal    
DOI: 10.1002/bimj.200510155     Document Type: Article

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