Temperature dependence of nickel stabilization in inorganic oxide matrices

Journal of the Air and Waste Management Association

Volumn 55, Issue 10, 2005, Pages 1451-1455

  Wei, Yu Ling ^a   Huang, Hui Chin ^a   Wang, Hsi Chih ^a   Yang, Yao Wen ^b   Lee, Jyh Fu ^b  

^a TUNGHAI UNIVERSITY   (Taiwan)

^b NATIONAL SYNCHROTRON RADIATION RESEARCH CENTER   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION SPECTRA; EXTENDED X RAY ABSORPTION FINE STRUCTURE SPECTROSCOPY; LEACHING; SCANNING ELECTRON MICROSCOPY; SPECTRUM ANALYSIS; SUPERCONDUCTING MATERIALS; X RAY ABSORPTION NEAR EDGE STRUCTURE SPECTROSCOPY; X RAY DIFFRACTION ANALYSIS;

EXTENDED X-RAY ABSORPTION FINE STRUCTURES; HEATING PROCESS; INCREASING TEMPERATURES; INORGANIC MATRICES; INORGANIC OXIDES; TEMPERATURE DEPENDENCE; THERMAL TREATMENT TEMPERATURE; X RAY ABSORPTION NEAR EDGE STRUCTURE;

TEMPERATURE DISTRIBUTION;

NICKEL; OXIDE;

ARTICLE; CHEMISTRY; SCANNING ELECTRON MICROSCOPY; TAIWAN; TEMPERATURE; X RAY DIFFRACTION;

MICROSCOPY, ELECTRON, SCANNING; NICKEL; OXIDES; TAIWAN; TEMPERATURE; X-RAY DIFFRACTION;

EID: 33644661796     PISSN: 10962247     EISSN: 21622906     Source Type: Journal    
DOI: 10.1080/10473289.2005.10464753     Document Type: Article

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