A new method of three-dimensional measurement by differential interference contrast microscope

Optics Communications

Volumn 260, Issue 1, 2006, Pages 117-126

  Ishiwata, Hiroshi ^a   Itoh, Masahide ^b   Yatagai, Toyohiko ^b  

^a OLYMPUS CORPORATION   (Japan)

^b UNIVERSITY OF TSUKUBA   (Japan)

Author keywords

3D measurement; Deconvolution; DIC microscope; Microstructure; MTF; Phase object

Indexed keywords

APPROXIMATION THEORY; IMAGE ANALYSIS; MICROSTRUCTURE; TRANSFER FUNCTIONS; WAVE INTERFERENCE;

DIC MICROSCOPE; MTF; PHASE OBJECT;

COHERENT LIGHT;

EID: 33644637916     PISSN: 00304018     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.optcom.2005.10.079     Document Type: Article

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