Plastic phase transitions in N-ethyl-N-methylpyrrolidinium Bis(trifluoromethanesulfonyl)imide

Chemistry of Materials

Volumn 18, Issue 4, 2006, Pages 934-938

  Henderson, Wesley A ^a   Young Jr , Victor G ^b   Passerini, Stefano ^c   Trulove, Paul C ^a   De Long, Hugh C ^d  

^a UNITED STATES NAVAL ACADEMY   (United States)

^b University of Minnesota   (United States)

^c ENEA C R CASACCIA   (Italy)

^d AIR FORCE OFFICE OF SCIENTIFIC RESEARCH   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ORDERED IONS; PLASTIC PHASE TRANSITIONS; SOLID-SOLID PHASE TRANSITIONS;

CRYSTAL STRUCTURE; PHASE TRANSITIONS; PLASTICS; POSITIVE IONS; SINGLE CRYSTALS;

ORGANIC COMPOUNDS;

EID: 33644635670     PISSN: 08974756     EISSN: None     Source Type: Journal    
DOI: 10.1021/cm051936f     Document Type: Article

References (38)

1. (a) MacFarlane, D. R.; Huang, J.; Forsyth, M. Nature 1999, 402, 792.
2. (b) MacFarlane, D. R.; Forsyth, M. Adv. Mater. 2001, 13, 957.
3. Alarco, P.-J.; Abu-Lebdeh, Y.; Armand, M. Solid State Ionics 2004, 175, 717.
4. (a) Bednarska-Bolek, B.; Jakubas, R.; Medycki, W.; Nowak, D.; Zaleski, J. J. Phys.: Condens. Matter 2002, 14, 3129.
5. (b) Medycki, W.; Swiergiel, J.; Hołderna-Natkaniec, K.; Jurga, K.; Jakubas, R. Solid State Nucl Magn. Res. 2004, 25, 129.
6. Jakubas, R.; Bednarska-Bolek, B.; Zaleski, J.; Medycki, W.; Holderna-Natkaniec, K.; Zielinski, P.; Galazka, M. Solid State Sci. 2005, 7, 381.
7. (a) Sorescu, D. C.; Thompson, D. L. J. Phys. Chem. A 2001, 105, 720.
8. (b) Coffey, C. S.; Sharma, J. Phys. Rev. B 1999, 60, 9365.
9. (a) MacFarlane, D. R.; Meakin, P.; Sun, J.; Amini, N.; Forsyth, M. J. Phys. Chem. B 1999, 103, 4164.
10. (b) Hill, A. J.; Huang, J.; Efthimiadis, J.; Meakin, P.; Forsyth, M.; MacFarlane, D. R. Solid State Ionics 2002, 154-155, 119.
11. Golding, J.; Hamid, N.; MacFarlane, D. R.; Forsyth, M.; Forsyth, C.; Collins, C.; Huang, J. Chem. Mater. 2001, 13, 558.
12. Forsyth, S. A.; Batten, S. R.; Dai, Q.; MacFarlane, D. R. Aust. J. Chem. 2004, 57, 121.
13. (e) Pringle, J. M.; Golding, J.; Forsyth, C. M.; Deacon, G. B.; Forsyth, M.; MacFarlane, D. R. J. Mater. Res. 2002, 12, 3475.
14. (f) Golding, J.; Forsyth, S.; MacFarlane, D. R.; Forsyth, M.; Deacon, G. B. Green Chem. 2002, 4, 223.
15. (g) MacFarlane, D. R.; Forsyth, S. A.; Golding, J.; Deacon, G. B. Green Chem. 2002, 4, 444.
16. (h) Forsyth, C. M.; MacFarlane, D. R.; Golding, J. J.; Huang, J.; Sun, J.; Forsyth, M. Chem. Mater. 2002, 14, 2103.
17. Sun, J.; MacFarlane, D. R.; Forsyth, M. J. Mater. Chem. 2001, 11, 2940.
18. (j) MacFarlane, D. R.; Golding, J.; Forsyth, S.; Forsyth, M.; Deacon, G. B. Chem. Commun. 2001, 1430.
19. Wasserscheid, P., Welton, R., Eds. Ionic Liquids in Synthesis; Wiley-VCH: Weinheim, Germany, 2003.
20. (a) Misaki, S.; Kashino, S.; Haisa, M. Acta Crystallogr., Sect. C 1989, 45, 917.
21. (b) Ono, H.; Ishimaru, S.; Ikeda, R.; Ishida, H. Bull. Chem. Soc. Jpn. 1999, 72, 2049.
22. Ishida, H.; Furukawa, Y.; Sato, S.; Kashino, S. J. Mol. Struct. 2000, 524, 95.
23. Adebahr, J.; Forsyth, M.; MacFarlane, D. R. Electrochim. Acta 2005, 50, 3853.
24. (e) Adebahr, J.; Seeber, A. J.; MacFarlane, D. R.; Forsyth, M. J. Appl. Phys. 2005, 97, 093904.
25. Henderson, W. A.; Passerini, S. Chem. Mater. 2004, 16, 2881.
26. (a) Johansson, P.; Gejji, S. P.; Tegenfeldt, J.; Lindgren, J. Electrochim. Acta 1998, 43, 1375.
27. (b) Arnaud, R.; Benrabah, B.; Sanchez, J.-Y. J. Phys. Chem. 1996, 100, 10882.
28. Xue, L.; Padgett, C. W.; DesMarteau, D. D.; Pennington, W. T. Solid State Sci. 2002, 4, 1535.
29. Henderson, W. A.; Herstedt, M.; Young, V. G., Jr.; Passerini, S.; De Long, H. C.; Trulove, P. C. Inorg. Chem., in press.
30. (a) Ishida, H.; Furukawa, Y.; Sato, S.; Kashino, S. J. Mol. Struct. 2000, 524, 95.
31. (b) Bednarska-Bolek, B.; Jakubas, R.; Medycki, W.; Nowak, D.; Zaleski, J. J. Phys.: Condens. Matter 2002, 14, 3129.
32. Sheldrick, G. CELL_NOW beta test V3; University of Gottingen, 2004.
33. SAINT V6.2; Bruker Analytical X-ray Systems, Madison, WI, 2001.
34. TWINABS V1.07: (a) Sheldrick, G. University of Gottingen, 2004.
35. (b) Blessing R. Acta Crystallogr., Sect. A 1995, 57, 33.
36. SHELXTL V6.12; Bruker Analytical X-ray Systems, Madison, WI, 2000.
37. Brennessel, W. W.; Young, V. G., Jr. Strip Redundant V1.3, A program for removing redundant reflections from SHELX HKLF 5 type data; 2003, unpublished.
38. Brennessel, W. W.; Young, V. G., Jr. SysAbsFilter V1.3, A program for removing systematically absense reflections from SHELX HKLF 5 type data; 2003, unpublished.