메뉴 건너뛰기




Volumn 21, Issue 3, 2006, Pages 311-316

Combining electrothermal vaporization inductively coupled plasma mass spectrometry with in situ TMAH thermochemolysis for the direct determination of trace impurities in a polymer-based photoresist

Author keywords

[No Author keywords available]

Indexed keywords

HEATING; IMPURITIES; INDUCTIVELY COUPLED PLASMA; MASS SPECTROMETRY; PHOTORESISTS; POLYMERS; TEMPERATURE DISTRIBUTION; VAPORIZATION;

EID: 33644627051     PISSN: 02679477     EISSN: None     Source Type: Journal    
DOI: 10.1039/b512233c     Document Type: Article
Times cited : (9)

References (27)
  • 4
    • 33644630991 scopus 로고    scopus 로고
    • J. Rakahahi and K. Yono, Agilent Technologies Inc., publication no. 5988-7100EN
    • J. Rakahahi and K. Yono, Agilent Technologies Inc., publication no. 5988-7100EN


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.