Development of surface thermal lensing technique in absorption and defect analyses of optical coatings

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5991, Issue , 2005, Pages

  He, Hongbo ^a   Li, Xia ^a   Fan, Shuhai ^a   Shao, Jianda ^a   Zhao, Yuanan ^a   Fan, Zhengxiu ^a  

^a SHANGHAI INSTITUTE OF OPTICS AND FINE MECHANICS   (China)

Author keywords

Absorption; Defect; Optical coatings; Sensitivity; Surface thermal lens

Indexed keywords

DEFECTS; HELIUM NEON LASERS; LIGHT ABSORPTION; OPTICAL INSTRUMENT LENSES; OPTICAL RESOLVING POWER; SIGNAL DETECTION;

PHOTO-THERMAL DEFECTS; SENSITIVITY; SPATIAL RESOLUTION; SURFACE THERMAL LENSES;

OPTICAL COATINGS;

EID: 33644592032     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.634106     Document Type: Conference Paper

References (5)

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5. Z.L.Wu, P.K.Kuo, R.L.Thomas, et al, 'Absorption measurement of thin films by using photothermal techniques: the influence of thermal properties", PROC. SPIE 2428, 1994.