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9744258054
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Pintado-Alba, A.; de la Riva, H.; Nieuwhuyzen, M.; Bautista, D.; Raithby, P. R.; Sparkes, H. A.; Teat, S. J.; López-de-Luzuriaga, J. M.; Lagunas, M. C. Dalton Trans. 2004, 3459-3467.
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5
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33644585633
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note
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int = 0.0871. A total of 72 223 reflections were measured for the angle range 2.95 < 2θ < 27.43°, and 9294 independent reflections were used in the refinement. The final residuals were wR2 = 0.0757 and R1 = 0.0310 [I > 2σ(I)].
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6
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33646767009
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ORTEP representations have been done using ORTEP-3 for Windows (Farrugia, L. J. J. Appl. Crystallogr. 1997, 30, 565). Ellipsoids are drawn at 40% (Figure 1) or 30% (Figure 2) probability.
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Farrugia, L.J.1
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7
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33644596068
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note
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int = 0.0942. A total of 41 379 reflections were measured for the angle range 1.52 < 2θ < 28.34°, and 11 259 independent reflections were used in the refinement. The final parameters were wR2 = 0.1374 and R1 = 0.0657 [I > 2σ(I)].
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8
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37049092777
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33644603682
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see ref 8
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l (M = Fe, Pt, Ru, or Re and n + m + l = 4-12; see ref 8).
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22
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33644583900
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(c) Vorontsov, I. I.; Kovalevsky, A. Y.; Chen, Y.-S.; Graber, T.; Gembicky, M.; Novozhilova, I. V.; Omary, M. A.; Coppens, P. Phys. Rev. Lett. 2005, 94, in press.
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