Fast microscopic method for large scale determination of structure, morphology, and quality of thin colloidal crystals

Langmuir

Volumn 22, Issue 4, 2006, Pages 1828-1838

  Schope H J ^a   Barreira Fontecha, A ^a   Konig H ^a   Marques Hueso, J ^a   Biehl, R ^b  

^a JOHANNES GUTENBERG UNIVERSITY   (Germany)

^b FORSCHUNGSZENTRUM JÜLICH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL STRUCTURE; DEFECTS; IMAGE ANALYSIS; MULTILAYERS; OPTICAL RESOLVING POWER;

BRAGG SCATTERING; COLLOIDAL MULTILAYER SYSTEMS;

COLLOID CHEMISTRY;

EID: 33644551897     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la0524972     Document Type: Article

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