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Volumn 72, Issue 21, 2005, Pages

X-ray diffraction study of elemental erbium to 70 GPa

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Indexed keywords


EID: 33644526296     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.72.214122     Document Type: Article
Times cited : (10)

References (18)
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    • See, for example, A. Polman and F. van Veggel, J. Opt. Soc. Am. B JOBPDE 0740-3224 10.1364/JOSAB.21.000871 21, 871 (2004).
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    • Sikka, S.K.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.