Statistical analysis of lifetime distribution for optical recordable disks

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 45, Issue 2 B, 2006, Pages 1460-1462

  Irie, Mitsuru ^a   Okino, Yoshihiro ^b  

^a OSAKA SANGYO UNIVERSITY   (Japan)

^b KANSAI UNIVERSITY   (Japan)

Author keywords

Archival data; Eyring acceleration model; Life expectancy; Optical disk; Reliability

Indexed keywords

DATA ACQUISITION; ERROR ANALYSIS; MATHEMATICAL MODELS; OPTICAL DISK STORAGE; PROBABILITY; STATISTICAL METHODS;

ARCHIVAL DATA; EYRING ACCELERATION MODEL; LIFE EXPECTANCY;

OPTICAL RECORDING;

EID: 33644522715     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/JJAP.45.1460     Document Type: Article

References (3)

1. M. Irie, Y. Okino and T. Kubo: Tech. Dig. ISOM 2004, 2004, p. 118.
2. P. A. Tobias and D. C. Trindade: Applied Reliability (Van Nostrand Reinhold, New York, 1995) 2nd ed., Chap. 7, p. 191.
3. ISO 18927 (2002).