A transmission electron microscopy study of porous silicon

Journal of Physics: Conference Series

Volumn 26, Issue 1, 2006, Pages 272-275

  Abrams, K J ^a   Donnelly, S E ^a  

^a UNIVERSITY OF SALFORD   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 33644520876     PISSN: 17426588     EISSN: 17426596     Source Type: Conference Proceeding    
DOI: 10.1088/1742-6596/26/1/065     Document Type: Conference Paper

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