The effects of crystallography on grain-boundary migration in alumina

Journal of Materials Science

Volumn 41, Issue 3, 2006, Pages 661-674

  Farrer, Jeffrey K ^a   Carter, C Barry ^b   Ravishankar, N ^c  

^a N243 Eyring Science Center   (United States)

^b UNIVERSITY OF MINNESOTA   (United States)

^c INDIAN INSTITUTE OF SCIENCE   (India)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON BACKSCATTER DIFFRACTION; POLYCRYSTALLINE ALUMINA; SINTERED INTERFACES;

CRYSTALLOGRAPHY; ELECTRON DIFFRACTION; GRAIN BOUNDARIES; SINTERING;

ALUMINA;

EID: 33644504199     PISSN: 00222461     EISSN: 15734803     Source Type: Journal    
DOI: 10.1007/s10853-006-6482-2     Document Type: Article

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