Towards the prioritization of regression test suites with data flow information

Proceedings of the ACM Symposium on Applied Computing

Volumn 2, Issue , 2005, Pages 1499-1504

  Rummel, Matthew J ^a   Kapfhammer, Gregory M ^a   Thall, Andrew ^a  

^a ALLEGHENY COLLEGE   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

PRIORITIZATION; SPACE OVERHEADS; TEST ADEQUACY; TEST EXECUTION PHASE;

COMPUTER ARCHITECTURE; COMPUTER PROGRAMMING; CRYSTAL DEFECTS; DATA FLOW ANALYSIS; GENETIC ENGINEERING; TEST FACILITIES;

REGRESSION ANALYSIS;

EID: 33644500128     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/1066677.1067016     Document Type: Conference Paper

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