Design of A precision CCD measurement system for beam characterization

Beijing Ligong Daxue Xuebao/Transaction of Beijing Institute of Technology

Volumn 20, Issue 4, 2000, Pages 471-474

  Sun, Wei ^a   Gao, Chun Qing ^a   Wei, Guang Hui ^a  

^a BEIJING INSTITUTE OF TECHNOLOGY   (China)

Author keywords

Beam characterization; Beam quality; Beam quality factor; Image background; Image noise

Indexed keywords

EID: 33644496256     PISSN: 10010645     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (3)

1. ISO/DIS 11146, Test methods for laser beam parameters[S]. 1995.
2. Sun Wei, Pang Changfu, Wei Guanghui. The synchronization measurement of pulsed laser beam[J]. J of Beijing Institute of TechnologyGn Chinese) , 1999, 19(6) :744-746.
3. Sun Wei, Wei Guanghui. Accurate measurement of laser beam parameters with CCD camera [Z]. Europto Conference, Industrial Lasers and Inspection, Munich, 1999.