Noise analysis and image focusing for magnetic force microscopy

Journal of Applied Physics

Volumn 73, Issue 10, 1993, Pages 5805-5807

  Che, Xiaodong ^a   Lederman, M ^a   Gibson, G A ^b   Bertram, H N ^a   Schultz, S ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b UNIVERSITY OF ARIZONA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 3343024971     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.353583     Document Type: Article

References (0)