High temperature characterization of reaction sintered SiC based materials

Journal of Nuclear Materials

Volumn 329-333, Issue 1-3 PART A, 2004, Pages 534-538

  Lee, S P ^a   Jin, J O ^a   Park, J S ^b   Kohyama, A ^b   Katoh, Y ^c   Yoon, H K ^a   Bae, D S ^a   Kim, I S ^a  

^a Dong Eui University   (South Korea)

^b KYOTO UNIVERSITY   (Japan)

^c OAK RIDGE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHARACTERIZATION; ENERGY DISPERSIVE SPECTROSCOPY; HEAT TREATMENT; HIGH TEMPERATURE OPERATIONS; MICROSTRUCTURE; OXIDATION; SCANNING ELECTRON MICROSCOPY; SILICON CARBIDE; STRENGTH OF MATERIALS;

INTERFACIAL DEBONDING; INTERNAL DEFECTS;

COMPOSITE MATERIALS;

EID: 3343017645     PISSN: 00223115     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jnucmat.2004.04.283     Document Type: Conference Paper

References (13)

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