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Physical Review Letters

Volumn 65, Issue 3, 1990, Pages 349-352

Observation of metallic adhesion using the scanning tunneling microscope

(3) Durig U a Zuger O a Pohl, D W a

a IBM RESEARCH ZURICH (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 3343009894 PISSN: 00319007 EISSN: None Source Type: Journal
DOI: 10.1103/PhysRevLett.65.349 Document Type: Article

Times cited : (165)

References (15)

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