Ellipsometric determination of thickness and refractive index at 1.3, 1.55, and 1.7 μm for In(1-x)GaxAsyP (1-y) films on InP

Journal of Applied Physics

Volumn 73, Issue 6, 1993, Pages 2965-2971

  Amiotti, M ^a   Landgren, G ^a  

^a SWEDISH INSTITUTE OF COMPUTER SCIENCE   (Sweden)

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EID: 3343004799     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.353028     Document Type: Article

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