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Physical Review Letters

Volumn 69, Issue 9, 1992, Pages 1423-1426

Electrical breakdown measurements of semicontinuous metal films

(3) Yagil, Yoad a Deutscher, Guy a Bergman, David J a

a TEL AVIV UNIVERSITY (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 3342986880 PISSN: 00319007 EISSN: None Source Type: Journal
DOI: 10.1103/PhysRevLett.69.1423 Document Type: Article

Times cited : (77)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.