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Volumn 35 A, Issue 6, 2004, Pages 1881-1888
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Quantitative characterization of microstructures of liquid-phase-sintered two-phase materials
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Author keywords
[No Author keywords available]
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Indexed keywords
CONTACT ANGLE;
CRYSTAL MICROSTRUCTURE;
GRAIN BOUNDARIES;
GRAIN GROWTH;
GRAIN SIZE AND SHAPE;
HIGH TEMPERATURE EFFECTS;
INTERFACIAL ENERGY;
SINTERING;
TUNGSTEN POWDER METALLURGY;
VOLUME FRACTION;
CONNECTIVITY;
CONTIGUITY;
EQUILIBRIUM DIHEDRAL ANGLES;
LIQUID PHASE SINTERING;
MICROSTRUCTURAL PARAMETERS;
QUANTITATIVE CHARACTERIZATION;
TUNGSTEN ALLOYS;
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EID: 3342970427
PISSN: 10735623
EISSN: None
Source Type: Journal
DOI: 10.1007/s11661-004-0096-6 Document Type: Article |
Times cited : (3)
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References (35)
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