Study of damage processes of silica by in situ hydrogen-ion-induced luminescence measurements

Journal of Nuclear Materials

Volumn 329-333, Issue 1-3 PART B, 2004, Pages 982-987

  Yoshida, Tomoko ^a   Tanabe, Tetsuo ^a   Watanabe, Manabu ^a   Takahara, Shogo ^a   Mizukami, Shintaro ^a  

^a NAGOYA UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHIZATION; HYDROGEN; IONS; LUMINESCENCE; SAMPLING; SINGLE CRYSTALS;

DAMAGE PROCESS; DEFECT CLUSTERING; EMISSION BANDS; LUMINESCENCE SPECTRA;

FUSED SILICA;

EID: 3342968675     PISSN: 00223115     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jnucmat.2004.04.068     Document Type: Conference Paper

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