Meson interactions in NMOS and CMOS static RAMs

IEEE Transactions on Nuclear Science

Volumn 32, Issue 6, 1985, Pages 4201-4205

  Schillaci, M E ^b   McCabe, C W ^b   Doss, J D ^b   Paciotti, M ^b   Berardo, P ^b  

^a CLARKSON UNIVERSITY   (United States)

^b LOS ALAMOS NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 3342965231     PISSN: 00189499     EISSN: 15581578     Source Type: Journal    
DOI: 10.1109/TNS.1985.4334094     Document Type: Article

References (7)

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2. J. F. Ziegler and W. A. Lanford, Effect of Cosmic Rays on Computer Memories. Science 206, 776–788 (1979).
3. D. J. Redman, R. M. Sega, and R. Joseph, Alpha Particle-Induced Soft Errors, Part Two. Military Electronics/Countermeasures, pp. 40–48, April, 1980.
4. J. F. Dicello, C. W. McCabe, J. D. Doss, and M. Paciotti, The Relative Efficiency of Soft-Error Induction in 4 K Static RAMs. IEEE Trans. Nucl. Science NS-30. 4613–4615 (1983).
5. W. H. Barkas and M. J. Berger, Tables of Energy Losses and Ranges of Heavy Charged Particles. pp. 103–172. Studies in Penetration of Charged Particles in Matter. Publication 1133, National Academy of Sciences, Washington, D. C. (1964).
6. R. Silberberg, C. H. Tsao, J. H. Adams, Jr., and J. R. Letaw, LET-Distributions and Radiation Doses due to Cosmic Rays.’ IEEE Trans. Nucl. Science, NS-30. 4405 (1983).
7. C. S. Guenzer, R. G. Allas. A. B. Campbell, J. M. Kidd, E. L. Petersen, N. Seeman, and E. A. Dolicki, Single Event Upsets in RAMs Induced by Protons at 4.2 GeV and Protons and Neutrons below 100 MeV.