High-resolution gamma backscatter imaging for technical applications

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 525, Issue 1-2, 2004, Pages 328-331

  Gerl, J ^a   Ameil, F ^a   Kojouharov, I ^a   Surowiec, A ^a  

^a GSI HELMHOLTZZENTRUM FÜR SCHWERIONENFORSCHUNG GMBH   (Germany)

Author keywords

ray imaging; Backscatter probe

Indexed keywords

BACKSCATTERING; GAMMA RAYS; PHOTOMULTIPLIERS; POSITRON ANNIHILATION SPECTROSCOPY; POSITRONS; PROBABILITY;

BACKSCATTER PROBE; COMPTON SCATTERING; GAMMA-RAY IMAGING; IMAGE RESOLUTION;

IMAGING TECHNIQUES;

EID: 3342960758     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2004.03.130     Document Type: Conference Paper

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