Local activation energy and shape factor of current-voltage curve as investigation tools for semiconductor barrier structures

Journal of Applied Physics

Volumn 80, Issue 10, 1996, Pages 5791-5798

  Popescu, Corneliu ^a   Apetz, Rolf ^b   Vescan, Lili ^b  

^a NATIONAL INSTITUTE OF MATERIALS PHYSICS   (Romania)

^b Inst F Schicht und Ionentechnik   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 3342952177     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.363635     Document Type: Review

References (14)

1. S. Arhenius, J. Phys. Chem. 4, 226 (1989).
2. J. J. Hood, Philos. Mag. 6, 371 (1978).
3. H. K. Henisch, Semiconductor Contacts (Clarendon, Oxford, 1984) pp. 88-90.
4. W. Shockley, Bell Syst. Tech. J. 28, 435 (1949).
5. C. H. Sah, R. Noyce, and W. Shockley, Proc. IRE 45, 1228 (1957).
6. N. Croitoru, M. Lazarescu, C. Popescu, M. Telnic, and L. Vescan, J. Non-Cryst. Solids 8-10, 781 (1972).
7. C. Popescu and H. K. Henisch, Phys. Rev. B 11, 1563 (1975).
8. T. Stoica and C. Popescu, Phys. Rev. B 17, 3972 (1978).
9. R. N. Hall, Phys. Rev. 87, 387 (1952).
10. W. Shockley and W. T. Read, Phys. Rev. 87, 835 (1952).
11. D. L. Scharfetter and H. K. Gummel, IEEE Trans. Electron Devices 16, 64 (1969).
12. Y. Moreau, J. C. Manifacier, and H. K. Henisch, J. Appl. Phys. 60, 2904 (1986).
13. R. Apetz, L. Vescan, R. Loo, R. Carius, and H. Lüth, Proc. ESSDERC 94, edited by C. Hill and P. Ashburn (Editions Frontieres, Gif-sur Yvette, Cedex, France, 1995) p. 653.
14. C. Popescu, R. Apetz, and L. Vescan (unpublished).