Phenyl 2-pyridyl ketone at 150 K

Acta Crystallographica Section C: Crystal Structure Communications

Volumn 54, Issue 5, 1998, Pages 674-676

  Sievert, Mark ^a   Dienelt, Ruediger ^a   Bock, Hans ^a  

^a GOETHE UNIVERSITY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 3342911572     PISSN: 01082701     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0108270197017940     Document Type: Article

References (8)

1. Bock, H., Dienelt, R., Schoedel, H. & Van, T. T. H. (1998). Struct. Chem. In the press.
2. Brandon, R. W., Closs, G., Davoust, C. E., Hutchinson, C. A. Jr, Kohler, B. E. & Silbey, R. (1965). J. Chem. Phys. 43, 2006-2019.
3. Fleischer, E. B., Sung, N. & Hawkinson, S. (1968). J. Phys. Chem. 72, 4311-4312.
4. Pauling, L. (1962). In Die Natur der Chemischen Bindung. Weinheim: Verlag Chemie.
5. Sheldrick, G. M. (1993). SHELXL93. Program for the Refinement of Crystal Structures. University of Göttingen, Germany.
6. Sheldrick, G. M. (1994). SHELXS94. Program for the Solution of Crystal Structures. University of Göttingen, Germany.
7. Siemens (1994a). XSCANS. X-ray Single Crystal Analysis System. Version 2.1. Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA.
8. Siemens (1994b). XP. Interactive Molecular Graphics Program. Version 5.03. Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA.