(NH4)2Na3(V3 W3O19).12H2O

Acta Crystallographica Section C: Crystal Structure Communications

Volumn 54, Issue 5, 1998, Pages 563-565

  Xu, Yan ^a   Xu, Ji Qing ^a   Yang, Guo Yu ^a   Wang, Tie Gang ^a   Xing, Yan ^b   Lin, Yong Hua ^b   Jia, Heng Qing ^b  

^a JUIN UNIVERSITY   (China)

^b CHANGCHUN INSTITUTE OF APPLIED CHEMISTRY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 3342902957     PISSN: 01082701     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0108270197016417     Document Type: Article

References (12)

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4. North, A. C. T., Phillips, D. C. & Mathews, F. S. (1968). Acta Cryst. A24, 351-359.
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6. Sheldrick, G. M. (1990). SHELXTL-Plus. Structure Determination Software Package. Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA.
7. Sheldrick, G. M. (1993). SHELXL93. Program for the Refinement of Crystal Structures. University of Göttingen, Germany.
8. Siemens (1994a). P4. Program for Data Collection. Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA.
9. Siemens (1994b). XSCANS. X-ray Single Crystal Analysis System. Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA.
10. Triki, S., Ouahab, L. & Grandjean, D. (1993). Acta Cryst. C49, 132-135.
11. Triki, S., Ouahab, L., Grandjean, D. & Fabre, J. M. (1991). Acta Cryst. C47, 1371-1373.
12. Triki, S., Ouahab, L., Halet, J. F., Peña, O., Padiou, J., Grandjean, D., Garrigou-Lagrange, C. & Delhaes, P. (1992). J. Chem. Soc. Dalton Trans, pp. 1217-1227.