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Volumn 70, Issue 4-5, 1998, Pages 951-960

Structural and electronic properties of silicon nitride materials

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EID: 3342887077     PISSN: 00207608     EISSN: None     Source Type: Journal    
DOI: 10.1002/(sici)1097-461x(1998)70:4/5<973::aid-qua43>3.0.co;2-y     Document Type: Article
Times cited : (9)

References (32)
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    • R. N. Katz, Science 208, 841 (1980).
    • (1980) Science , vol.208 , pp. 841
    • Katz, R.N.1
  • 26
    • 10644250257 scopus 로고
    • P. Hohenberg and W. Kohn, Phys. Rev. 136, 864B (1964); W. Kohn and L. J. Sham, Phys. Rev. 140, 1133A (1965).
    • (1964) Phys. Rev. , vol.136
    • Hohenberg, P.1    Kohn, W.2
  • 27
    • 0042113153 scopus 로고
    • P. Hohenberg and W. Kohn, Phys. Rev. 136, 864B (1964); W. Kohn and L. J. Sham, Phys. Rev. 140, 1133A (1965).
    • (1965) Phys. Rev. , vol.140
    • Kohn, W.1    Sham, L.J.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.