Limits on irradiation-induced thermal conductivity and electrical resistivity in silicon carbide materials

Journal of Nuclear Materials

Volumn 329-333, Issue 1-3 PART A, 2004, Pages 524-529

  Snead, L L ^a  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CONDUCTIVITY; FABRICATION; IONIZING RADIATION; MAGNETOHYDRODYNAMICS; NEUTRON IRRADIATION; OPTIMIZATION; STOICHIOMETRY; THERMAL CONDUCTIVITY;

BOUNDARY SCATTERING; NEUTRON DISPLACEMENT DAMAGE; NUCLEAR TRANSMUTATIONS;

SILICON CARBIDE;

EID: 3342875972     PISSN: 00223115     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jnucmat.2004.04.294     Document Type: Conference Paper

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