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Volumn 502, Issue 1-2, 2006, Pages 164-169

Uncertainties in the determination of thermal emissivity by measurement of reflectance using Fourier transform spectrometers

Author keywords

Emissivity; Fourier transform spectrometers; Measurement intercomparison; Reflectance

Indexed keywords

MIRRORS; OPTICAL COATINGS; OPTICAL RESOLVING POWER; REFLECTION; UNCERTAIN SYSTEMS;

EID: 33344476735     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2005.07.262     Document Type: Conference Paper
Times cited : (7)

References (3)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.