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Volumn 502, Issue 1-2, 2006, Pages 164-169
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Uncertainties in the determination of thermal emissivity by measurement of reflectance using Fourier transform spectrometers
a
TNO
(Netherlands)
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Author keywords
Emissivity; Fourier transform spectrometers; Measurement intercomparison; Reflectance
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Indexed keywords
MIRRORS;
OPTICAL COATINGS;
OPTICAL RESOLVING POWER;
REFLECTION;
UNCERTAIN SYSTEMS;
EMISSIVITY;
FOURIER TRANSFORM SPECTROMETERS;
MEASUREMENT INTERCOMPARISON;
GLAZES;
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EID: 33344476735
PISSN: 00406090
EISSN: None
Source Type: Journal
DOI: 10.1016/j.tsf.2005.07.262 Document Type: Conference Paper |
Times cited : (7)
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References (3)
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