Interface relaxation and electronic corrugation in the Pb/Si (111) -Pb-α-√3×√3

Physical Review B - Condensed Matter and Materials Physics

Volumn 71, Issue 19, 2005, Pages

  Hupalo, M ^a   Yeh, V ^a   Chan, T L ^a   Wang, C Z ^a   Ho, K M ^a   Tringides, M C ^a  

^a IOWA STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 33344472483     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.71.193408     Document Type: Article

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