SCOPUS 정보 검색 플랫폼

Volumn 106, Issue 4-5, 2006, Pages 432-438

Obtaining TEM images with a uniform deviation parameter

Author keywords

Defects; Deviation parameter; Diffraction contrast; Electron microscope design and characterization; Instrument control and alignment; Spot scan; Transmission electron microscopy

Indexed keywords

COMPUTER SOFTWARE; DIFFRACTION; DISLOCATIONS (CRYSTALS); ELECTRONS; IMAGING TECHNIQUES; MAGNETIC FIELD EFFECTS;

DIFFRACTION CONTRAST; INSTRUMENT CONTROL AND ALIGNMENT; SPOT SCAN;

TRANSMISSION ELECTRON MICROSCOPY;

ARTICLE; COMPUTER; IMAGE ANALYSIS; IMMERSION; OPTICAL INSTRUMENTATION; PARAMETER; TRANSMISSION ELECTRON MICROSCOPY;

EID: 33344470374 PISSN: 03043991 EISSN: None Source Type: Journal
DOI: 10.1016/j.ultramic.2005.12.002 Document Type: Article

Times cited : (8)

References (10)

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10
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.