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Volumn 71, Issue 20, 2005, Pages

Density functional theory description of hole-trapping in Si O2: A self-interaction-corrected approach

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EID: 33344469727     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.71.205210     Document Type: Article
Times cited : (96)

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