Automated magnification calibration in transmission electron microscopy using Fourier analysis of replica images

Ultramicroscopy

Volumn 106, Issue 4-5, 2006, Pages 255-260

  Van Der Laak, Jeroen A W M ^a   Dijkman, Henry B P M ^a   Pahlplatz, Martin M M ^a  

^a RADBOUD UNIVERSITY MEDICAL CENTER   (Netherlands)

Author keywords

Calibration; Digital image analysis; Geometry; Pattern recognition; Transmission electron microscopy

Indexed keywords

CALIBRATION; DIFFRACTION GRATINGS; FOURIER OPTICS; GEOMETRY; IMAGE ANALYSIS; PATTERN RECOGNITION SYSTEMS;

DIGITAL IMAGE ANALYSIS; GRATING PATTERNS;

TRANSMISSION ELECTRON MICROSCOPY;

ACCURACY; ARTICLE; DIGITAL IMAGING; FOURIER ANALYSIS; IMAGE ANALYSIS; MAGNIFICATION RADIOGRAPHY; TRANSMISSION ELECTRON MICROSCOPY;

AUTOMATION; CALIBRATION; CATALASE; FOURIER ANALYSIS; MICROSCOPY, ELECTRON, TRANSMISSION; REPLICA TECHNIQUES; SIGNAL PROCESSING, COMPUTER-ASSISTED;

EID: 33344466387     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2005.08.001     Document Type: Article

References (8)

1. R. Luftig J. Ultrastruct. Res. 20 1967 91
2. N.G. Wrigley J. Ultrastruct. Res. 24 1968 454
3. J.P. McCaffrey, and J.M. Baribeau Microsc. Res. Tech. 32 1995 449
4. N.H. Olson, and T.S. Baker Ultramicroscopy 30 1989 281
5. J.A. Derose, and J. Revel J. Microsc. 195 1999 64
6. I.M. Watt J. Phys. E.: Sci. Instrum. 19 1986 668
7. R.O. Duda, and P.E. Hart Pattern Classification and Scene Analysis 1973 Wiley New York (Chapter 8)
8. C.V. Howard, and M.G. Reed Unbiased Stereology 1998 Springer New York (Chapter 1)