Microwave dielectric properties and microstructures of La(Mg 1/2Ti1/2)O3 with CuO-doped

Materials Science and Engineering: B

Volumn 128, Issue 1-3, 2006, Pages 98-102

  Chen, Yuan Bin ^a   Huang, Cheng Liang ^a   Lo, Ching Wen ^a  

^a NATIONAL CHENG KUNG UNIVERSITY   (Taiwan)

Author keywords

Ceramics; Dielectric properties; Oxides; X ray diffraction

Indexed keywords

COPPER OXIDES; DIELECTRIC PROPERTIES; DOPING (ADDITIVES); OXIDES; SINTERING; X RAY DIFFRACTION;

SINTERING TEMPERATURE; TEMPERATURE COEFFICIENT;

LANTHANUM COMPOUNDS;

EID: 33344466382     PISSN: 09215107     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.mseb.2005.11.027     Document Type: Article

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