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Volumn 32, Issue 6, 1985, Pages 4180-4184

Methods for calculating SEU rates for bipolar and NMOS circuits

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[No Author keywords available]

Indexed keywords


EID: 33344455245     PISSN: 00189499     EISSN: 15581578     Source Type: Journal    
DOI: 10.1109/TNS.1985.4334090     Document Type: Article
Times cited : (11)

References (13)
  • 11
    • 0020915915 scopus 로고
    • Charge-Deposition in Thin Slabs of Silicon Induced by Energetic Protons
    • S. El-Teleaty, G.E. Farrell, and P.J. McNulty,” Charge-Deposition in Thin Slabs of Silicon Induced by Energetic Protons’”, IEEE Trans. Nucl. Sci. NS-30, 4394 (1983).
    • (1983) IEEE Trans. Nucl. Sci. , vol.NS-30 , Issue.4394
    • El-Teleaty, S.1    Farrell, G.E.2    McNulty, P.J.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.