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Volumn 73, Issue 3, 2006, Pages

High-resolution photoemission study of the temperature-dependent c-f hybridization gap in the Kondo semiconductor YbB12

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Indexed keywords


EID: 33244491710     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.73.033202     Document Type: Article
Times cited : (33)

References (23)
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    • PHYBE3 0921-4526 10.1016/j.physb.2004.06.027
    • We have conducted temperature-dependent hard x-ray PES using hν=5.95 keV, and found the similar temperature dependence [Y. Takeda, Physica B PHYBE3 0921-4526 10.1016/j.physb.2004.06.027 351, 286 (2004)].
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    • Takeda, Y.1
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    • Mutou, T.1    Hirashima, D.S.2


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