Identifying sensitive parameters at fatigue crack nucleation sites using microstructual simulation models

Materials Damage Prognosis - Proceedings of a Symposium of the Materials Science and Technology 2004 Conference

Volumn , Issue , 2005, Pages 105-112

  Tryon, Robert G ^a   Dey, Animesh ^a   Krishnan, Ganapathi ^a   Ravi Chandran, K S ^b   Oja, Michael ^b  

^a VEXTEC Corporation   (United States)

^b UNIVERSITY OF UTAH   (United States)

Author keywords

Fatigue; Nickel; Probabilistic; Prognosis; Waspaloy

Indexed keywords

COMPUTER SIMULATION; CRACK INITIATION; MATHEMATICAL MODELS; NUCLEATION; PARAMETER ESTIMATION; SENSITIVITY ANALYSIS;

MATERIAL PARAMETERS; PROBABILISTIC; PROGNOSIS; WASPALOY;

FATIGUE OF MATERIALS;

EID: 33244484127     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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