Analysis of current flow in polycrystalline TFTs

IEEE Transactions on Electron Devices

Volumn 53, Issue 3, 2006, Pages 474-480

  Eccleston, William ^a  

^a UNIVERSITY OF LIVERPOOL   (United Kingdom)

Author keywords

Models; Off current; On current; Polysilicon

Indexed keywords

CARRIER CONCENTRATION; ELECTRIC CONDUCTANCE; ELECTRIC CURRENTS; ELECTRON TRAPS; GRAIN BOUNDARIES; HOLE TRAPS; MATHEMATICAL MODELS; POLYCRYSTALLINE MATERIALS; POLYSILICON;

CURRENT FLOW; POLYCRYSTALLINE SEMICONDUCTOR; POLYCRYSTALLINE THIN FILM TRANSISTORS; SURFACE CARRIER CONCENTRATION; SURFACE CONDUCTANCE;

THIN FILM TRANSISTORS;

EID: 33244475792     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/TED.2005.864388     Document Type: Article

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