NiCuZn ferrite thin films for RF integrated inductors

Materials Letters

Volumn 60, Issue 11, 2006, Pages 1403-1406

  Liu, Feng ^a   Ren, Tianling ^b   Yang, Chen ^b   Liu, Litian ^b   Wang, A Z ^c   Yu, Jun ^a  

^a HUAZHONG UNIVERSITY OF SCIENCE AND TECHNOLOGY   (China)

^b TSINGHUA UNIVERSITY   (China)

^c ILLINOIS INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

Integrated inductors; Ni0.4Cu0.2Zn0.4Fe2O4 thin films; Rapid thermal annealing; Sol gel method

Indexed keywords

ATOMIC FORCE MICROSCOPY; CRYSTALLIZATION; ELECTRIC INDUCTORS; FERRITES; LOW TEMPERATURE EFFECTS; NICKEL COMPOUNDS; RAPID THERMAL ANNEALING; SCANNING ELECTRON MICROSCOPY; SOL-GELS; X RAY DIFFRACTION ANALYSIS;

CRYSTALLIZATION TEMPERATURE; INTEGRATED INDUCTORS;

MAGNETIC THIN FILMS;

EID: 33144489018     PISSN: 0167577X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.matlet.2005.11.050     Document Type: Article

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