Subspace identification for FDI in systems with non-uniformly sampled multirate data

Automatica

Volumn 42, Issue 4, 2006, Pages 619-627

  Li, Weihua ^a,b   Han, Zhengang ^a,c   Shah, Sirish L ^a,b  

^a UNIVERSITY OF ALBERTA   (Canada)

^b NSERC MATRIKON ASRA ^*  (Canada)

^c Albian Sands Energy Inc   (Canada)

Author keywords

Lifting; Non uniformly sampled multirate data; Residual models; Sensor fault detection and isolation; Subspace methods of identification

Indexed keywords

LIFTING; NON-UNIFORMLY SAMPLED MULTIRATE DATA; RESIDUAL MODELS; SENSOR FAULT DETECTION AND ISOLATION; SUBSPACE METHODS OF IDENTIFICATION;

FAULT TOLERANT COMPUTER SYSTEMS; MATHEMATICAL MODELS; SENSORS; VECTORS;

IDENTIFICATION (CONTROL SYSTEMS);

EID: 33144486691     PISSN: 00051098     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.automatica.2005.11.010     Document Type: Article

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