Degradation assessment for machinery prognostics using Hidden Markov Models

Proceedings of the ASME International Design Engineering Technical Conferences and Computers and Information in Engineering Conference - DETC2005

Volumn 1 A, Issue , 2005, Pages 531-537

  Qiu, Hai ^a   Liao, Haitao ^a   Lee, Jay ^a  

^a UNIVERSITY OF CINCINNATI   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DEGRADATION; MACHINERY; MATHEMATICAL MODELS; RANDOM PROCESSES;

HIDDEN MARKOV MODELS (HMMS); STATIC SIGNALS; SYSTEM DEGRADATION;

MARKOV PROCESSES;

EID: 33144484188     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1115/detc2005-84193     Document Type: Conference Paper

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