Towards rapid redesign - Pattern-based redesign planning for large-scale and complex redesign problems

Proceedings of the ASME International Design Engineering Technical Conferences and Computers and Information in Engineering Conference - DETC2005

Volumn 2 B, Issue , 2005, Pages 989-998

  Chen, Li ^a,b   Li, Simon ^b  

^a UNITED TECHNOLOGIES RESEARCH CENTER   (United States)

^b UNIVERSITY OF TORONTO   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTATIONAL METHODS; LARGE SCALE SYSTEMS; PLANNING; PROBLEM SOLVING;

RE-COMPUTING TASKS; TWO-STAGE REDESIGN PLANNING;

PATTERN RECOGNITION;

EID: 33144464240     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1115/detc2005-84890     Document Type: Conference Paper

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