Conductive atomic force microscopic (c-AFM) studies of Au/MoS2 nanocomposite films

Proceedings of the World Tribology Congress III - 2005

Volumn , Issue , 2005, Pages 819-820

  Kim, Hyun I ^a   Lince, Jeffrey R ^a  

^a AEROSPACE CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CONTACTS; ELECTRIC RESISTANCE; FRICTION; GOLD COMPOUNDS; SURFACE TOPOGRAPHY; THIN FILMS;

CURRENT IMAGES; NANOCOMPOSITE FILMS; REAL-SPACE VISUALIZATION;

ATOMIC FORCE MICROSCOPY;

EID: 33144459290     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1115/wtc2005-63987     Document Type: Conference Paper

References (1)

1. 2 solid lubricant films over a wide contact stress range, Tribology Letters 17(3), pp. 419-428.