Characterization of new electrooptical PMN-PT single crystal

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5962, Issue 1, 2005, Pages

  Pavlenko, V ^a   Akimov, A ^b   Kurilkina, S ^a   Utkin, I ^a   Lee, Han Young ^c  

^a B I STEPANOV INSTITUTE OF PHYSICS   (Belarus)

^b INSTITUTE FOR MATHEMATICS   (Belarus)

^c Korea Electronic Technology Institute (KETI)   (South Korea)

Author keywords

Electrooptical coefficients; Optical transparency; Refractive index

Indexed keywords

CHARACTERIZATION; ELECTROOPTICAL DEVICES; FERROELECTRIC DEVICES; LATTICE CONSTANTS; PEROVSKITE; REFRACTIVE INDEX;

CUBIC PEROVSKITE; ELECTROOPTICAL COEFFICIENTS; OPTICAL TRANSPARENCY;

SINGLE CRYSTALS;

EID: 33144458242     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.624790     Document Type: Conference Paper

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