Effects of polymer gate dielectrics roughness on pentacene field-effect transistors

Applied Physics Letters

Volumn 88, Issue 7, 2006, Pages

  Shin, Kwonwoo ^a   Yang, Chanwoo ^a   Yang, Sang Yoon ^a   Jeon, Hayoung ^a   Park, Chan Eon ^a  

^a Pohang University of Science and Technology (POSTECH)   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALLINITY; DIELECTRICS ROUGHNESS; GATE DIELECTRICS; PENTACENE;

ANODIC OXIDATION; INTERFACIAL ENERGY; PERMITTIVITY; POLYMETHYL METHACRYLATES; SURFACE ROUGHNESS; X RAY DIFFRACTION ANALYSIS;

FIELD EFFECT TRANSISTORS;

EID: 32944477050     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2176858     Document Type: Article

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