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Volumn 37, Issue 2, 2006, Pages 105-109

Thin-film TiO 2 electrode surface characterization upon CO 2 reduction processes

Author keywords

AES and XPS characterization; Dip coating process; Indium tin oxide (ITO); Semiconductor thin film electrodes; Sol gel oxides

Indexed keywords

DIP COATING PROCESS; INDIUM TIN OXIDE (ITO); SOL-GEL OXIDES;

EID: 32944468287     PISSN: 09280707     EISSN: None     Source Type: Journal    
DOI: 10.1007/s10971-006-6427-x     Document Type: Conference Paper
Times cited : (28)

References (27)
  • 13
    • 32944481576 scopus 로고    scopus 로고
    • M. Spetch, A. Bandi, F. Baumgart, C.M. Murray, and J. Gretz (Elsevier, Amsterdam, 1988)
    • M. Spetch, A. Bandi, F. Baumgart, C.M. Murray, and J. Gretz (Elsevier, Amsterdam, 1988).


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.