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Volumn 5, Issue 10, 2005, Pages 1660-1664
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Nanomagnetic behavior of fullerene thin films in earth magnetic field in dark and under polarization light influences
a
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Author keywords
Fullerenes; Magnetism; Nanotechnology; Polarization light; Thin films
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Indexed keywords
FILMS THICKNESS;
MAGNETIC FIELD INTENSITY;
PROTON MAGNETOMETERS;
FULLERENES;
LIGHT POLARIZATION;
MAGNETIC FIELDS;
MAGNETOMETERS;
NANOTECHNOLOGY;
THIN FILMS;
FULLERENE DERIVATIVE;
NANOMATERIAL;
ARTICLE;
ARTIFICIAL MEMBRANE;
ASTRONOMY;
CHEMISTRY;
CRYSTALLIZATION;
DARKNESS;
ELECTROMAGNETIC FIELD;
LIGHT;
MAGNETISM;
MATERIALS TESTING;
METHODOLOGY;
NANOTECHNOLOGY;
PARTICLE SIZE;
RADIATION DOSE;
RADIATION EXPOSURE;
RADIATION RESPONSE;
RADIOMETRY;
SURFACE PROPERTY;
CRYSTALLIZATION;
DARKNESS;
DOSE-RESPONSE RELATIONSHIP, RADIATION;
EARTH (PLANET);
ELECTROMAGNETIC FIELDS;
FULLERENES;
LIGHT;
MAGNETICS;
MATERIALS TESTING;
MEMBRANES, ARTIFICIAL;
NANOSTRUCTURES;
NANOTECHNOLOGY;
PARTICLE SIZE;
RADIATION DOSAGE;
RADIOMETRY;
SURFACE PROPERTIES;
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EID: 32944463169
PISSN: 15334880
EISSN: None
Source Type: Journal
DOI: 10.1166/jnn.2005.185 Document Type: Article |
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Times cited : (5)
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References (12)
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